发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATION PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device of SiP formation in which an inductance with a large Q-value is provided. SOLUTION: Insulation layers (15, 17) are formed by laying resin layers on a substrate 10 in layers, and rewiring layers (16, 18) are formed while being buried in the insulation layers (15, 17). An inductance L is formed while being buried in the insulation layers (15, 17) and connected with the rewiring layers (16, 18), and eddy current suppression layers (S1, S2) are formed while being buried in the insulation layers (15, 17) between the substrate 10 and the inductance L. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216769(A) 申请公布日期 2006.08.17
申请号 JP20050027798 申请日期 2005.02.03
申请人 SONY CORP 发明人 YAMAGATA OSAMU
分类号 H01L23/12;H01L23/58 主分类号 H01L23/12
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