发明名称 CIRCUIT BOARD TESTING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a circuit board testing device which can test effectively and stably in an electric continuity of a wiring formed on the circuit board by utilizing an electron generated by a photoelectric effect. SOLUTION: When a wiring to be inspected is the electric continuity, by application of a voltage to a ball grid 121b of the wiring 121 to be inspected and a plate electrode 51, an electric field is generated between a pad part 121a of the wiring 121 to be inspected and the plate electrode 51. The electron emitted from the pad part 121a of the wiring 121 to be inspected by the photoelectric effect due to an electromagnetic irradiation is attracted by the electric field into the plate electrode 51 side. According to this, the electric continuity path which returns from a power source 80 to the power source 80 via the plate electrode 51 and the wiring 121 to be inspected is formed. The electric continuity of the wiring 121 to be inspected can be inspected by measuring a current flowing through the wiring 121 to be inspected. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006215042(A) 申请公布日期 2006.08.17
申请号 JP20060067135 申请日期 2006.03.13
申请人 NIDEC-READ CORP 发明人 TSUJI YOSHIO;YAMADA MASAYOSHI
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
代理机构 代理人
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