发明名称 Elément semiconducteur à résistance inverse contrôlée
摘要 1,073,748. Semi-conductor devices. COMPAGNIE GENERALS D'ELECTRICITE. Aug. 17, 1964 [Aug. 20, 1963; Dec. 24, 1963] No. 33605/64. Heading H1K. One region 3 of a semi-conductor body containing a PN junction between regions 3 and 4 is soldered under pressure to a metal plate 13a by means of an alloy layer 14a, the shapes of the components being such that the mechanical stresses set up in the region 3 cause the equipotential surfaces 15, when a potential difference is applied across the junction between the plate 13a and another electrode 1, to be closer together in the interior of the region 3 near the plate 13a (as shown at 16) than at the surface of the region near the edges of the junction (as shown at 17). The object is to allow a non-destructive leakage current to flow through the junction under reverse overload conditions, the reverse resistance decreasing suddenly at a threshold voltage. The device may be a diode rectifier or may form part of a larger device, such as a transistor.
申请公布号 FR1375839(A) 申请公布日期 1964.10.23
申请号 FR19630945147 申请日期 1963.08.20
申请人 COMPAGNIE GENERALE D'ELECTRICITE 发明人 CHOFFART PIERRE;SOLERA JEAN-CLAUDE
分类号 H01L21/00;H01L23/48;H01L23/482;H01L29/00 主分类号 H01L21/00
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