发明名称 TEST SYSTEM
摘要 PROBLEM TO BE SOLVED: To realize a test system which suppresses degradation of accuracy in a temporal measurement of an object to be tested, having a high-voltage output. SOLUTION: The test system which is realized by improving a system used for testing the object to be tested outputting a high-voltage pulse signal, comprises a determining section which inputs the pulse signal of the object to be tested and determines its high level and low level, based on high-level and low-level threshold voltages; a transformer into which the determination result of the determining section is input; and a time-measuring section which inputs the output of this transformer and carries out the temporal measurement by using a low-voltage signal. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006214827(A) 申请公布日期 2006.08.17
申请号 JP20050026860 申请日期 2005.02.02
申请人 YOKOGAWA ELECTRIC CORP 发明人 ISHIBACHI MUNEO;IWASHITA SATORU
分类号 G01R31/28 主分类号 G01R31/28
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