| 摘要 |
PROBLEM TO BE SOLVED: To more easily execute waveform confirmation of a surrounding circuit provided in DUT board than before by applying a testing apparatus to one inspecting a characteristic of an integrated circuit, for example. SOLUTION: A connector 13 for connecting with a probe 14 of an oscilloscope is provided in this invention, and an input signal input by way of the connector 13 is waveform-analyzed with a waveform analyzing mechanism by a digital signal processor 7 and the like. COPYRIGHT: (C)2006,JPO&NCIPI
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