| 摘要 |
PROBLEM TO BE SOLVED: To provide a three-dimensional geometry measuring system and the like which can measure a three-dimensional geometry in a short time even with the increase of the number of the three-dimensional geometry measuring system and even for a large scale geometry measurement. SOLUTION: The system has a grating pattern projecting means 101 projecting a sine wave grating pattern on a measuring object 107, a grating drive means moving the grating pattern projecting means by every certain quantity to a constant direction maintaining the grating pattern projecting means, and a plurality of three-dimensional geometry measuring devices 103 to 106 provided with an image photographing means 100 which photographs the image of the measuring object whose sine wave grating pattern is projected. In the three-dimensional geometry measuring system, each grating pattern projecting means simultaneously projects sine wave grating patterns with different wavelengths to each other. Because the wavelengths of the projected grating patterns are different, three-dimensional geometry measurement becomes possible even with interference of pattern light to each adjacent device, and the three dimensional geometry measuring devices can simultaneously measure. COPYRIGHT: (C)2006,JPO&NCIPI
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