发明名称 APPARATUS AND METHOD OF LASER BEAM MACHINING
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an apparatus of laser beam machining, which apparatus can accurately cut off a semiconductor substrate along planned cutting-off lines. <P>SOLUTION: The laser beam machining apparatus 100 forms reformed regions inside the semiconductor substrate 1 so as to become starting points of the cutting-off, and comprises: a mounting stand 107 on which the semiconductor substrate 1 is mounted; a laser beam source 101 for radiating the laser beam L; a condenser lens 105 which converges the laser beam L radiated from the laser beam source 101 inside the semiconductor substrate 1 mounted on the mounting stand 107, and forms the reformed regions at the position of the converged point P of the laser beam L; a stage control section 115 and an overall control section 127 for moving the converged point P of the laser beam L along the planned cutting-off lines 5 arranged on the semiconductor substrate 1; an infrared transparent illuminator 116 for illuminating the semiconductor substrate 1 mounted on the mounting stand 107 by infrared rays; and an image pickup element 121 for imaging the reformed regions formed inside the semiconductor substrate 1 illuminated by infrared rays by means of the infrared transparent illuminator 116. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006212708(A) 申请公布日期 2006.08.17
申请号 JP20060069936 申请日期 2006.03.14
申请人 HAMAMATSU PHOTONICS KK 发明人 FUKUYO FUMITSUGU;FUKUMITSU KENJI;UCHIYAMA NAOKI
分类号 B23K26/38;B23K26/03;B23K26/40;B23K101/40;H01L21/301 主分类号 B23K26/38
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