| 摘要 |
PROBLEM TO BE SOLVED: To provide a failure diagnosing method of a matrix converter by which the short-circuit state and the open state of a semiconductor gate are detected by a low-cost constitution and by a simple failure detecting procedure with no special device required. SOLUTION: In the matrix converter 5, a failure of a power portion (a semiconductor device) is determined without adding any special failure diagnosing circuit to a normal circuit by using a check pattern which compares a diagnostic pattern of gate drive at diagnosing the failure with the voltage detection result of an input and an output at the time, and then the failure is dealt with by using the procedure to locate its failure portion. COPYRIGHT: (C)2006,JPO&NCIPI
|
