| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for generating a scan path circuit for shortening a time required for a scan test. SOLUTION: A defective part is set by a defective part setting part 102, and an input signal line reaching the defective part is retrieved by a retrieval part 103. Whether or not a register connected to one of the retrieved input signal lines is connected to a plurality of gate circuits is detected by a common register detecting part 104. When the register connected to two or more gate circuits is detected by a common register detecting part 103, a redundant register is generated by a redundant register generating part 107. Then, writing proper for a common register and the redundant register is performed by a wiring connecting part 108, so that a semiconductor integrated circuit configured to be suitable for a scan test can be generated. COPYRIGHT: (C)2006,JPO&NCIPI
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