MEMORY TESTING METHOD, MEMORY TESTING CIRCUIT, AND SEMICONDUCTOR DEVICE

摘要

Provided is a memory testing method for feeding a test result of a memory back to the memory. The memory is divided into a test target portion and a test result holding portion. Write data is fed to the test target portion, and the test result fed back is fed to the test result holding portion. The test target portion and the test result holding portion are interchanged to perform a test targeted for the test target portion and a test targeted for the test result holding portion, thereby to specify the address and bits of a troubled portion in the memory.