| 摘要 |
PROBLEM TO BE SOLVED: To provide an electrooptical device enabling precise inspection of presence/absence of defective wiring pattern formation by using a probe, and also to provide a manufacturing method of the electrooptical device, and an electronic device equipped with such an electrooptical device. SOLUTION: In the electrooptical device, connection terminals to be connected with a driver, and dummy terminals or positioning marks are provided in a driver mounting area on a substrate for the electrooptical device, an inspection area for examining the state of formation of a plurality of wiring patterns by making use of a part of the plurality of wiring patterns is provided in or near the driver mounting area, and the dummy terminals or the positioning marks are divided in such a manner as to match with pitch intervals of the plurality of wiring patterns in the inspection area. COPYRIGHT: (C)2006,JPO&NCIPI
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