发明名称 RESISTANCE ELEMENT AND SEMICONDUCTOR DEVICE HAVING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a resistance element having a temperature dependency coefficient of resistivity that is smaller than that of resistivity that a semiconductor material for composing the resistance element has. SOLUTION: The resistance element 10 has n-type polycrystalline silicon 11 and p-type polycrystalline silicon 12. The n-type polycrystalline silicon 11 has a positive temperature dependency coefficient of resistivity, while the p-type polycrystalline silicon 12 has a negative one. Silicides 13, 14 are formed at both the ends of one main surface 11A of the n-type polycrystalline silicon 11, and silicides 17, 18 are formed at both the ends of one main surface 12A of the p-type polycrystalline silicon 12. The n-type polycrystalline silicon 11 is connected in series with the p-type polycrystalline silicon 12 via the silicide 14, a contact 16, a metal layer 23, a contact 19, and the silicide 17. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216607(A) 申请公布日期 2006.08.17
申请号 JP20050025391 申请日期 2005.02.01
申请人 RICOH CO LTD 发明人 OTSUKA MASAYA;OKADA YOJI;ANDO YUICHI;HONJO TOMOHIRO;TERAMITSU TOSHIO
分类号 H01L27/04;H01L21/28;H01L21/3205;H01L21/768;H01L21/822;H01L23/52;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L27/04
代理机构 代理人
主权项
地址