发明名称 |
DRIVER IC |
摘要 |
PROBLEM TO BE SOLVED: To provide a driver IC that can inspect a leak current only in an output control circuit comprising a CMOS of a low-voltage block. SOLUTION: A low-voltage block 2 and a high-voltage block 3 are integrated on one semiconductor chip. The low-voltage block 2 comprises a reset circuit 4 operated by a low voltage power supply (VDD) 7 and a CMOS output control circuit 5 receiving the output signal of the reset circuit 4, comprising a CMOS operated by VDD 7 and performing logic operation. The high voltage block 3 comprises a P-type MOS transistor 61 and an N-type MOS transistor 62 controlled by the output signal of the CMOS output control circuit 5 and operated by a high voltage power supply (VDDH) 8 and has a push-pull type driver output 10. The first GND 91 of the reset circuit 4 and the second GND 92 of the CMOS control circuit 5 are not connected to each other within the semiconductor chip. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006215454(A) |
申请公布日期 |
2006.08.17 |
申请号 |
JP20050030394 |
申请日期 |
2005.02.07 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HISHIKAWA NAOKI;KANEDA JINSAKU;MATSUNAGA HIROKI;ANDO HITOSHI;MAEDA EISAKU;MAEJIMA AKIHIRO |
分类号 |
G09G3/28;G09G3/20;H01L21/822;H01L27/04 |
主分类号 |
G09G3/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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