发明名称 DRIVER IC
摘要 PROBLEM TO BE SOLVED: To provide a driver IC that can inspect a leak current only in an output control circuit comprising a CMOS of a low-voltage block. SOLUTION: A low-voltage block 2 and a high-voltage block 3 are integrated on one semiconductor chip. The low-voltage block 2 comprises a reset circuit 4 operated by a low voltage power supply (VDD) 7 and a CMOS output control circuit 5 receiving the output signal of the reset circuit 4, comprising a CMOS operated by VDD 7 and performing logic operation. The high voltage block 3 comprises a P-type MOS transistor 61 and an N-type MOS transistor 62 controlled by the output signal of the CMOS output control circuit 5 and operated by a high voltage power supply (VDDH) 8 and has a push-pull type driver output 10. The first GND 91 of the reset circuit 4 and the second GND 92 of the CMOS control circuit 5 are not connected to each other within the semiconductor chip. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006215454(A) 申请公布日期 2006.08.17
申请号 JP20050030394 申请日期 2005.02.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HISHIKAWA NAOKI;KANEDA JINSAKU;MATSUNAGA HIROKI;ANDO HITOSHI;MAEDA EISAKU;MAEJIMA AKIHIRO
分类号 G09G3/28;G09G3/20;H01L21/822;H01L27/04 主分类号 G09G3/28
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