发明名称 |
PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE |
摘要 |
<p>There is provided a process comprising the steps of forming insulating film (12) on semiconductor substrate (10) having a first region and a second region; forming insulating film (14) of an oxide material containing aluminum on the insulating film (12); carrying out a selective ion implantation of inactive ions in the insulating film (14) of the first region; and selectively removing the insulating film (14) of the first region through wet etching. In this process, the insulating film (14) can be removed with high selection ratio relative to the foundation semiconductor substrate (10), and damage introduction in the semiconductor substrate (10) by the removal of the insulating film (14) can be reduced.</p> |
申请公布号 |
WO2006085367(A1) |
申请公布日期 |
2006.08.17 |
申请号 |
WO2005JP01950 |
申请日期 |
2005.02.09 |
申请人 |
FUJITSU LIMITED;KOBAYASHI, MASAHIRO;SATOH, AKIRA;SUZUKI, KUNIHIRO |
发明人 |
KOBAYASHI, MASAHIRO;SATOH, AKIRA;SUZUKI, KUNIHIRO |
分类号 |
H01L21/306;H01L21/8247;H01L27/10;H01L27/115 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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