发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device for preventing generation of a defective product because of flowing of solder during the assembling work. <P>SOLUTION: Since a second principal surface of a firs end 7a of a frame 7 is formed so that it is accommodated within the internal side more than the front surface of an electrode 4, when the electrode 4 is connected by soldering with the first end 7a, the solder shows wet up-diffusion toward the side surface of the first end 7a from the external circumferential surface of the electrode 4 located at the external side of the first end 7a together with the self-alignment, for locating and keeping the first end 7a to the center of the electrode 4 with the surface tension and wet up-diffusion phenomenon. Consequently, a solder extension preventing means can be established. Accordingly, it can be prevented that the solder leaks to the external side of the electrode 4 and is adhered to the front surface or side surface of a semiconductor chip 3. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006216736(A) 申请公布日期 2006.08.17
申请号 JP20050027248 申请日期 2005.02.03
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YOKOE TOSHISHI
分类号 H01L21/60 主分类号 H01L21/60
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