发明名称 RADIATION INSPECTION DEVICE AND RADIATION INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To simplify a circuit determining an initial incident position of the radiation, in a radiation inspection device. SOLUTION: A test substance 17 placed on a bed 16 is located at the center of an imager 2 and a plurality of radiation inspection devices 4 are deployed at its surroundings. The radiation inspection devices 4 are disposed in a direction normal to the body axis of test substance 17 in a multistage fashion, where the radiation inspection devices 4a, 4b, and 4c are located sequentially at about three stages from near to far the test substance 17. A plurality of combinations of radiation inspection devices 4 of a three-stage fashion are deployed at ring-shaped surrounding the test substance 17. Then, signals ofγrays detected at each radiation inspection device 4 are processed. Lastly, when a plurality of signals are deemed as being simultaneously inspected in a circuit inside the radiation inspection devices 4, by the use of the radiation inspection devices 4, which one fell incident first can be determined by using a system choosing the one nearer to the test substance 17 according to energy of radiation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006214916(A) 申请公布日期 2006.08.17
申请号 JP20050029176 申请日期 2005.02.04
申请人 HITACHI LTD 发明人 KOJIMA SHINICHI;UENO YUICHIRO;KOBASHI KEIJI;ISHIZU TAKAAKI;AMAMIYA KENSUKE
分类号 G01T1/161;A61B6/03 主分类号 G01T1/161
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