| 摘要 |
The invention relates to a method of measuring geometric variables of a three-dimensional structure contained in an object from at least on image representing the object, having the following steps:-use of a deformable first model describing the structure, the shape of which model can be described by parameters,-adjustment of the first model to the structure in the image,-determination of the parameters at which the first model exhibits optimum conformity with the structure,-use of a deformable second model describing the structure, which second model in shape corresponds to the first model, and which in addition contains at least one geometric variable,-modification of the second model according to the parameters determined, and-derivation of the geometric variable(s) from the modified second model. |
