发明名称 Light intensity distribution measuring method and light intensity distribution measuring device
摘要 A light intensity distribution measuring method for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser comprises the steps of measuring light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser and applying their measurement results to a t distribution function to calculate the light intensity distribution. A light intensity distribution measuring device is also described.
申请公布号 US7092080(B2) 申请公布日期 2006.08.15
申请号 US20030717125 申请日期 2003.11.19
申请人 NIDEC SANKYO CORPORATION 发明人 SAKAI HIROSHI
分类号 G01J1/00;G01J1/02;G01J1/42;H01S5/00 主分类号 G01J1/00
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