发明名称 |
Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy |
摘要 |
A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.
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申请公布号 |
US7089787(B2) |
申请公布日期 |
2006.08.15 |
申请号 |
US20040887608 |
申请日期 |
2004.07.08 |
申请人 |
BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY |
发明人 |
SAHIN OZGUR;QUATE CALVIN F.;SOLGAARD OLAV |
分类号 |
G01B5/28;G01Q60/34;G01Q60/38 |
主分类号 |
G01B5/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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