发明名称 Semiconductor device and method of manufacturing the same
摘要 An insulating film having dielectric constant not greater than 2.7 is provided above a semiconductor substrate. A via comprises a conductive material, which is provided in a via hole formed in the insulating film. A first interconnection comprises a conductive material, which is provided in an interconnection trench formed on the via in the insulating film. A first high-density region is formed in the insulating film, and has a cylindrical shape surrounding the via, an inner surface common to the boundary of the via hole, and a film density higher than the insulating film.
申请公布号 US7091618(B2) 申请公布日期 2006.08.15
申请号 US20040806413 申请日期 2004.03.23
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YOSHIZAWA TAKAHIKO;MATSUNAGA NORIAKI;NAKAMURA NAOFUMI
分类号 H01L23/522;H01L23/532;H01L21/768;H01L23/48;H01L29/40 主分类号 H01L23/522
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