发明名称 Semiconductor memory device invalidating improper control command
摘要 A control circuit in a semiconductor memory device accessing a memory cell for a plurality of cycles includes an internal command generating circuit and a mask signal generating circuit. Upon receiving a control command, the internal command generating circuit outputs an internal signal instructing an operation to access the memory cell at H level when a mask signal is at L level, while outputs an internal signal at L level when the mask signal is at H level, because a latch circuit is reset. The mask signal generating circuit outputs the mask signal at H level for a following cycle, when the internal signal is output at H level.
申请公布号 US7092314(B2) 申请公布日期 2006.08.15
申请号 US20050174472 申请日期 2005.07.06
申请人 RENESAS TECHNOLOGY CORP. 发明人 SETOGAWA JUN
分类号 G11C8/00;G11C11/401;G11C7/10;G11C7/22;G11C11/407;G11C11/4076 主分类号 G11C8/00
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