发明名称 Fabrication method of Si film
摘要 A method of preparing a semiconductor film on a substrate is disclosed. The method includes arranging an insulating substrate in a deposition chamber and depositing a semiconductor film onto the insulating substrate using ion beam deposition, wherein a temperature of the insulating substrate during the depositing does not exceed 250° C. The method can produce a thin film transistor. The disclosed ion beam deposition method forms, at lower temperature and with low impurities, a film morphology with desired smoothness and grain size. Deposition of semiconductor films on low melting point substrates, such as plastic flexible substrates, is enables.
申请公布号 KR100612868(B1) 申请公布日期 2006.08.14
申请号 KR20040090495 申请日期 2004.11.08
申请人 发明人
分类号 H01L21/20;H01L21/203 主分类号 H01L21/20
代理机构 代理人
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