TEST-MODE ENTRY METHOD AND TEST-MODE ENTRY CIRCUIT FOR THE SAME,申请号KR20040087768-传众专利搜索

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发明名称	TEST-MODE ENTRY METHOD AND TEST-MODE ENTRY CIRCUIT FOR THE SAME
摘要
申请公布号	KR100612034(B1)	申请公布日期	2006.08.11
申请号	KR20040087768	申请日期	2004.11.01
申请人		发明人
分类号	G11C29/00;G11C7/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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