发明名称 POSITION POSTURE MEASURING METHOD AND DEVICE
摘要 A position posture measuring device for measuring position and posture with both stability and accuracy. An image showing one or more indexes arranged in a space is captured, and the indexes are detected from the captured image. When a plurality of indexes are detected, the distribution range is determined and an algorithm applied to the position posture computation is selected depending on the size (S3033, S3050, S3060). For example, if the indexes are distributed over a sufficiently wide range, six parameters of the position and posture of an imaging device are computed as unknown values (S3070). As the distribution range of the indexes are smaller, the degree of freedom of the unknown parameters to be determined is made smaller (S3035, S3025).
申请公布号 WO2006082928(A1) 申请公布日期 2006.08.10
申请号 WO2006JP301876 申请日期 2006.02.03
申请人 CANON KABUSHIKI KAISHA;SATOH, KIYOHIDE;UCHIYAMA, SHINJI;ENDO, TAKAAKI;MORITA, KENJI 发明人 SATOH, KIYOHIDE;UCHIYAMA, SHINJI;ENDO, TAKAAKI;MORITA, KENJI
分类号 G06T1/00;G01B11/00;G06T7/60 主分类号 G06T1/00
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