发明名称 SEMICONDUCTOR DEVICE WITH MULTI-GATE DIELECTRIC AND METHOD FOR MANUFACTURING THE SAME
摘要 Disclosed are a semiconductor device with dual gate dielectric layers and a method for fabricating the same. The semiconductor device includes: a silicon substrate divided into a cell region where NMOS transistors are formed and a peripheral region where NMOS and PMOS transistors are formed; a targeted silicon oxide layer formed on the silicon substrate in the cell region; an oxynitride layer formed on the silicon substrate in the peripheral region; a first gate structure formed in the cell region; a second gate structure formed on the oxynitride layer in an NMOS region of the peripheral region; and a third gate structure formed on the oxynitride layer in a PMOS region of the peripheral region.
申请公布号 KR100611784(B1) 申请公布日期 2006.08.10
申请号 KR20040115352 申请日期 2004.12.29
申请人 发明人
分类号 H01L21/31;H01L21/336;H01L21/8228 主分类号 H01L21/31
代理机构 代理人
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