发明名称 |
Method of extracting locations of nucleic acid array features |
摘要 |
Methods for correcting systematic errors in the measured position of deposited features of a nucleic acid array on a substrate. Systematic errors are modeled by an algorithmic model based on measuring the positions (and possibly other properties) of a subset of the features, and a model is constructed for predicting deviations in feature position from an ideal grid. Deviations arising in the deposition process, the scanning process, or both may be corrected.
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申请公布号 |
US2006177116(A1) |
申请公布日期 |
2006.08.10 |
申请号 |
US20060375658 |
申请日期 |
2006.03.13 |
申请人 |
CATTELL HERBERT F;DORSEL ANDREAS N;SADLER JOHN W;SAMPAS NICHOLAS M |
发明人 |
CATTELL HERBERT F.;DORSEL ANDREAS N.;SADLER JOHN W.;SAMPAS NICHOLAS M. |
分类号 |
C12Q1/68;G06K9/00;G06T7/00 |
主分类号 |
C12Q1/68 |
代理机构 |
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主权项 |
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地址 |
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