发明名称 ALIGNER, ALIGNING METHOD, AND PROCESS FOR FABRICATING DEVICE HAVING MICROPATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide an EUV aligner in which the lifetime up to overhaul is prolonged by reducing adsorption of organic substances into a reflector as much as possible so that a carbon coating is not formed easily and suppressing deterioration in optical characteristics. <P>SOLUTION: The aligner comprises a projection optical system having a plurality of reflectors (M1-M6) performing exposure and transfer of a pattern formed on a mask onto a photosensitive substrate using extreme ultravoilet light wherein at least one of the plurality of reflectors is held in a state insulated from the outside. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006210602(A) 申请公布日期 2006.08.10
申请号 JP20050020003 申请日期 2005.01.27
申请人 NIKON CORP 发明人 AOKI TAKASHI
分类号 H01L21/027;G03F7/20;G21K1/06;G21K5/02 主分类号 H01L21/027
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