发明名称 |
ALIGNER, ALIGNING METHOD, AND PROCESS FOR FABRICATING DEVICE HAVING MICROPATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an EUV aligner in which the lifetime up to overhaul is prolonged by reducing adsorption of organic substances into a reflector as much as possible so that a carbon coating is not formed easily and suppressing deterioration in optical characteristics. <P>SOLUTION: The aligner comprises a projection optical system having a plurality of reflectors (M1-M6) performing exposure and transfer of a pattern formed on a mask onto a photosensitive substrate using extreme ultravoilet light wherein at least one of the plurality of reflectors is held in a state insulated from the outside. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006210602(A) |
申请公布日期 |
2006.08.10 |
申请号 |
JP20050020003 |
申请日期 |
2005.01.27 |
申请人 |
NIKON CORP |
发明人 |
AOKI TAKASHI |
分类号 |
H01L21/027;G03F7/20;G21K1/06;G21K5/02 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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