发明名称 Semiconductor device and its manufacturing method
摘要 A semiconductor device includes a switching element formed on a semiconductor substrate, a first interconnect layer formed on the semiconductor substrate and having a first wiring connected to one terminal of the switching element, a ferroelectric capacitor formed on the first interconnect layer and having a first electrode connected to the one terminal of the switching element via the first wiring, a first protective film formed on the ferroelectric capacitor and the first interconnect layer, a second interconnect layer formed on the first protective film and having a second wiring connected to a second electrode of the ferroelectric capacitor and a first interlayer insulating film having a dielectric constant of 4 or more, and a third interconnect layer formed on the second interconnect layer and having a second interlayer insulating film with a dielectric constant of less than 4.
申请公布号 US2006175645(A1) 申请公布日期 2006.08.10
申请号 US20060373308 申请日期 2006.03.13
申请人 KANAYA HIROYUKI;KUNISHIMA IWAO 发明人 KANAYA HIROYUKI;KUNISHIMA IWAO
分类号 H01L21/768;H01L29/94;G11C8/02;H01L21/8246;H01L27/105 主分类号 H01L21/768
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