| 摘要 |
FIELD: micro-electronics, namely, methods for determining potentially unreliable integral circuits during production process, and also at inlet control at plants of manufacturers of radio electronic equipment. ^ SUBSTANCE: on integral circuits, by outputs "power-common point" intensiveness of noise is measured at critical and nominal power voltages. On basis of relatively change of value of noise intensiveness, measured at two power voltages, integral circuits are divided on reliable and potentially unreliable. ^ EFFECT: increased efficiency. ^ 1 tbl |
