发明名称 SEMICONDUCTOR ELEMENT HAVING STEPPED GATE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor element which can prevent the threshold voltage of a cell from dropping; and a manufacturing method thereof. <P>SOLUTION: A method of manufacturing a semiconductor element having a stepped gate comprises: a step of preparing a semiconductor substrate 21 having a first active region 101A and a second active region 102 that is formed at a position higher than the first active region 101A; a step of rounding the boundary region between the first active region 101A and the second active region 102; a step of forming a gate insulating film 31 on the entire substrate including the rounded boundary region; a step of forming a gate pattern 200 which has a stepped structure extending from a portion of the first active region 101A to a portion of the second active region 102 on the gate insulating film 31 on the boundary region; a step of forming gate spacers 34 and 35 on both sidewalls of the gate pattern 200; and a step of forming a first cell junction 36A in the first active region 101A and a second cell junction 36B in the second active region 102. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006210913(A) 申请公布日期 2006.08.10
申请号 JP20060003240 申请日期 2006.01.11
申请人 HYNIX SEMICONDUCTOR INC 发明人 TEI DAIGU;OH SANG-WON
分类号 H01L27/108;H01L21/76;H01L21/8234;H01L21/8242;H01L27/088;H01L29/41;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L27/108
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