发明名称 LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem in lithography apparatus wherein when critical size is reduced to print a fine pattern, that is, when resolution is increased, the focus depth becomes shallow, and prints a three-dimensional format, such as with a contact hole. <P>SOLUTION: Focus depth is increased using polarization. A polarization modifier 20 is inserted between a patterning device (for example, mask) MA of lithography apparatus 10 and a projection system PL, with the polarization modifier having birefringence changing radially. When the polarization modifier is made of a material, showing circular double refraction such as crystal, the focus depth becomes approximately twice as large as the focus depth when there is nothing inserted. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006210917(A) 申请公布日期 2006.08.10
申请号 JP20060014631 申请日期 2006.01.24
申请人 ASML NETHERLANDS BV;CARL ZEISS SMT AG 发明人 TOTZECK MICHAEL;MILLER SKIP;BERND PETER GEH
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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