发明名称 PATENT ANALYZING SYSTEM, DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To improve precision as the data of a patent map. SOLUTION: This patent analyzing device is provided with an input device 41 for inputting technology data, a storage device 44 in which score data weighted for every patent information parameter are stored, a data processor 42 for ranking every patent information parameter for an applicant, and for applying scores corresponding to the rank to every patent according to the score data, and for preparing a patent list in the order of scores for every applicant, and for automatically extracting patents whose scores are high rank as patents included in a core technology and a display device 43 for displaying tabulation/analysis results prepared by the data processor 42. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006209174(A) 申请公布日期 2006.08.10
申请号 JP20050016344 申请日期 2005.01.25
申请人 NEC CORP;INPATEKKU KK 发明人 EMOTO SHINICHI;ARAI MASAHIKO;NAKAMURA TERUYUKI;ARAI KIMIO;ARIGA YASUHIRO;TANIGUCHI YOSHIHISA;IKETANI RYOJI
分类号 G06F17/30 主分类号 G06F17/30
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