发明名称 Method for forming insulating film, method for forming multilayer structure and method for manufacturing semiconductor device
摘要 Disclosed is a method for effectively forming a Low-k insulating film. The method comprises the steps of: spin-coating on an underlying layer a precursor solution formed by dispersing Low-k materials in a solvent to form a coating film, subjecting the coating film to a baking treatment under heating for about several minutes at a temperature near a boiling point of the solvent, forming, on the coating film after the baking treatment, an SiC barrier film using a CVD method, and subjecting the coating film to a hydrogen plasma treatment through the barrier film continuously using the same CVD apparatus as used in forming the barrier film without taking out the coating film from the CVD apparatus.
申请公布号 US2006178017(A1) 申请公布日期 2006.08.10
申请号 US20050171318 申请日期 2005.07.01
申请人 FUJITSU LIMITED 发明人 OWADA TAMOTSU;WATATANI HIROFUMI;NAKATA YOSHIHIRO;OZAKI SHIROU;FUKUYAMA SHUN-ICHI
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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