发明名称 Method for producing a mask layout avoiding imaging errors for a mask
摘要 A method for producing a final mask layout ( 20 ') avoids imaging errors. A provisional auxiliary mask layout ( 110 ) is produced, in particular in accordance with a predefined electrical circuit diagram, and is converted into the final mask layout ( 20 ') with the aid of an OPC method. A main structure ( 120, 130 ) of the provisional auxiliary mask layout ( 110 ) is assigned optically non-resolvable auxiliary structures ( 160, 320 ). Exclusively the optically non-resolvable auxiliary structures ( 160, 320 ) are altered in the context of the OPC method, and the main structure ( 120, 130 ) itself remains unaltered.
申请公布号 US2006177744(A1) 申请公布日期 2006.08.10
申请号 US20060332828 申请日期 2006.01.13
申请人 BODENDORF CHRISTOF;KURTH KARIN;MEYNE CHRISTIAN;NASH EVA 发明人 BODENDORF CHRISTOF;KURTH KARIN;MEYNE CHRISTIAN;NASH EVA
分类号 G03C5/00;G03F1/00;G03F1/36;G06F17/50 主分类号 G03C5/00
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