Apparatus and method for using mems filters to test electronic circuits

摘要

A mixed-signal integrated circuit testing device (10) includes test electronics (140) for generating a test signal for input to a device under test (50) and receiving a response signal from the device under test (50), and an interface (150) connected between the test electronics (140) and the device under test (50). The interface (150) includes at least one Micro Electro-Mechanical Systems, MEM, filter (160) for filtering an analog signal associated with one of the test signal and the response signal.