发明名称 |
Protection of the test mode of an integrated circuit |
摘要 |
<p>The integrated circuit has an access controller (2) with outputs for applying a distinct control signal to receiving terminal of respective memory cells (31-38). A test module (5) measures a signal between the output of the controller and terminal for determining whether the measured signal differs from the signal applied on the output by the controller to block formation of shift register (1) if the difference is determined.</p> |
申请公布号 |
EP1688753(A1) |
申请公布日期 |
2006.08.09 |
申请号 |
EP20060290205 |
申请日期 |
2006.02.06 |
申请人 |
STMICROELECTRONICS SA |
发明人 |
BANCEL, FREDERIC;HELY, DAVID |
分类号 |
G01R31/3185 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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