发明名称 Process to make high-k transistor dielectrics
摘要 A method of reducing impurities in a high-k dielectric layer comprising the following steps. A substrate is provided. A high-k dielectric layer having impurities is formed over the substrate. The high-k dielectric layer being formed by an MOCVD or an ALCVD process. The high-k dielectric layer is annealed to reduce the impurities within the high-k dielectric layer.
申请公布号 US7087480(B1) 申请公布日期 2006.08.08
申请号 US20020125216 申请日期 2002.04.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YAO LIANG-GI;WANG MING-FANG;CHEN SHIH-CHANG;LIANG MON-SONG
分类号 H01L21/31 主分类号 H01L21/31
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