发明名称 Etchant formulation for selectively removing thin films in the presence of copper, tin, and lead
摘要 The invention relates to a ball-limiting metallurgy (BLM) etching system and process. The BLM stack is provided for an electrical device that contains an aluminum layer disposed upon a metal first layer. A metal upper layer is disposed above the metal second layer, and an alternative metal third layer is disposed between the metal second layer and the metal upper layer. The etching system and process utilizes an etching solution that includes a nitrogen-containing heterocyclic compound, an ammonium hydroxide compound, an oxidizer, and a metal halide compound. Etching conditions prevent any metallization that is dissolved from redepositing, thus avoiding lowered yields.
申请公布号 US7087996(B2) 申请公布日期 2006.08.08
申请号 US20040867886 申请日期 2004.06.14
申请人 INTEL CORPORATION 发明人 DANIELSON DONALD;HUANG TZEUN-LUH;SCOVELL DAWN L.;WILLIS KEITH
分类号 H01L23/48;C23F1/10;C23F1/44;H01L21/3213;H01L21/60 主分类号 H01L23/48
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