发明名称 Detection of contamination in imaging systems by fluorescence and/or absorption spectroscopy
摘要 Process and system for detection of contamination in an imaging system, including providing an imaging system having one or more element having a surface for reflecting or refracting first incident radiation; mounting with respect to at least one of the one or more element one or more detector capable of sensing third radiation emitted or transmitted by one or more contaminant on the surface of the one or more element when second radiation is absorbed by the one or more contaminant; applying the first incident radiation and/or the second radiation to the at least one element; and detecting with the one or more detector the third radiation emitted or transmitted by the one or more contaminant.
申请公布号 US7087907(B1) 申请公布日期 2006.08.08
申请号 US20040770032 申请日期 2004.02.02
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LALOVIC IVAN;LAFONTAINE BRUNO M.
分类号 G01N21/88 主分类号 G01N21/88
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