发明名称 Semiconductor integrated circuit including anti-fuse and method for manufacturing the same
摘要 An anti-fuse is manufactured by forming an isolation region including an insulating material layer buried in a surface of a device formation region on a surface of a semiconductor substrate, and by forming diffusion regions at both sides of the isolation region, then by contacting electrodes to the respective diffusion regions. The anti-fuse is initially in a non-conductive state, and is programmed to be in a permanently conductive state by a simple writing circuit.
申请公布号 US7087974(B2) 申请公布日期 2006.08.08
申请号 US20040773213 申请日期 2004.02.09
申请人 KAWASAKI MICROELECTRONICS INC. 发明人 KUNO ISAMU;KATAGIRI TOMOHARU
分类号 H01L21/82;H01L29/76;G11C17/18;H01L21/762;H01L23/525;H01L27/06 主分类号 H01L21/82
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