发明名称 Linear chemical mechanical planarization (CMP) system and method for planarizing a wafer in a single CMP module
摘要 A linear chemical mechanical planarization (CMP) belt pad includes a first portion comprised of a first pad material, e.g., polyurethane, and a second portion comprised of a second pad material, e.g., porous rubber. The first portion has a first end and a second end. The second portion is situated between the first and second ends of the first portion and extends substantially across a width of the belt pad. Alternatively, the second portion may be embedded in the first portion such that a peripheral surface of the second portion is surrounded by a surface of the first portion. A linear CMP system and a method for planarizing a wafer in a single linear CMP module also are described.
申请公布号 US7086936(B1) 申请公布日期 2006.08.08
申请号 US20030743923 申请日期 2003.12.22
申请人 LAM RESEARCH CORPORATION 发明人 KIERMASZ ADRIAN
分类号 B24B9/00 主分类号 B24B9/00
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