| 摘要 |
<P>PROBLEM TO BE SOLVED: To obtain a semiconductor memory device provided with a mechanism in which the specific memory domain of a single product and the specific memory chip of an MCP product decided to be defective in a test process are separated. <P>SOLUTION: A PROM circuit is provided to each memory chip, a switch in which the input end can be set to the logical value of the other side in accordance with the output signal level of the corresponding PROM circuit is provided at a chip enable input end in a selective receiving circuit of each memory chip, and a chip enable reception refusing signal setting the chip enable input end to the logical value of the other side of the corresponding switch is written in the PROM circuit in the memory chip decided to be defective in the test process deciding the normal/defective condition of each memory chip. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
