Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel

摘要

An electronics device includes: a plurality of signal lines; and a drawing portion to which the plurality of signal lines are drawn to be disposed substantially in parallel with each other, in which the drawing portion has an inspection terminal allocating layer in which predetermined ones out of the signal lines are insulatively covered in a direction intersecting the drawing direction of the signal lines, while other predetermined ones out of the signal lines that are not insulatively covered are exposed as an inspection signal input terminal.