发明名称 CIRCUIT BOARD INSPECTION METHOD AND ITS DEVICE
摘要 PROBLEM TO BE SOLVED: To inspect a high resistance short circuit between adjacent circuit wirings only by measurement of, for example, capacitance. SOLUTION: In this circuit board inspection method, when inspecting the quality of a plurality of circuit wirings 11 formed as an independent pattern on one surface of a circuit board 10, the other surface side of the circuit board 10 has a common electrode board 20 opposed to the plurality of the circuit wirings 11 and having the capacitance between its respective wirings, and the circuit wirings 11 are selected one by one, and a measuring signal of a predetermined frequency is impressed between its selected circuit wiring 11 and the common electrode board 20, and the quality of the circuit wiring 11 is inspected on the basis of a capacitance value measured thereby. At least two kinds of measuring signals different in a frequency are impressed on the same circuit wiring 11, and when a difference value of the capacitance value measured by the respective measuring signals is larger than a predetermined reference value, a determination is made that there is a short circuit in its circuit wiring 11. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006200973(A) 申请公布日期 2006.08.03
申请号 JP20050011452 申请日期 2005.01.19
申请人 HIOKI EE CORP 发明人 SATO YOSHINORI
分类号 G01R31/02;G01R27/26;H05K3/00 主分类号 G01R31/02
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