发明名称 REDUCTION OF SOURCE AND DRAIN PARASITIC CAPACITANCE IN CMOS DEVICES
摘要 A method for fabricating a semiconductor-based device includes providing a doped semiconductor substrate, introducing a second dopant into the substrate to define a pn junction, and introducing a neutralizing species into the substrate in the neighborhood of the pn junction to reduce a capacitance associated with the pn junction. A semiconductor-based device includes a semiconductor substrate having first and second dopants, and a neutralizing species. The first and second dopants define a pn junction, and the neutralizing species neutralizes a portion of the first dopant in the neighborhood of the pn junction to decrease a capacitance associated with the pn junction.
申请公布号 WO2006026180(A3) 申请公布日期 2006.08.03
申请号 WO2005US29454 申请日期 2005.08.18
申请人 VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.;EROKHIN, YURI;JEONG, UKYO;SCHEUER, JAY, T.;WALTHER, STEVEN, R. 发明人 EROKHIN, YURI;JEONG, UKYO;SCHEUER, JAY, T.;WALTHER, STEVEN, R.
分类号 H01L21/225;H01L21/265;H01L21/336;H01L29/78 主分类号 H01L21/225
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