发明名称 Nitride semiconductor device
摘要 A multi-layered structure in which a p-3C-SiC layer 102 is formed above a p-Si substrate 101 is formed, above which an I-GaN layer (channel layer) 103 , an n-AlGaN layer (barrier layer) 104 are formed. A source electrode 201 , a drain electrode 202 , and a gate electrode 203 are formed above the n-AlGaN layer 104 . The source electrode 201 and the drain electrode 202 form an ohmic contact with the n-AlGaN layer 104 . The gate electrode 203 forms a Schottky junction with the n-AlGaN layer 104.
申请公布号 US2006170003(A1) 申请公布日期 2006.08.03
申请号 US20050149208 申请日期 2005.06.10
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAITO WATARU;OMURA ICHIRO;MORIZUKA KOUHEI
分类号 H01L31/109 主分类号 H01L31/109
代理机构 代理人
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