发明名称 MOS TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>Example embodiments of the present invention relate to a metal oxide semiconductor (MOS) transistor and a method of manufacturing the MOS transistor. A MOS transistor may include a substrate, a semiconductor pattern, a gate insulation layer and/or source-drain regions. The substrate may include an active region and/or a field region. The semiconductor pattern may extend from the active region and may extend along the active region in a first direction. The gate insulation layer may be formed on the substrate to cover the semiconductor pattern. The gate electrode may be formed on the semiconductor pattern. The gate electrode may have a linear shape extending in the first direction. The source-drain regions may be formed at portions of the active region adjacent to the gate electrode in a second direction substantially perpendicular to the first direction. A channel of the transistor may be formed along a sidewall and an upper surface of the semiconductor pattern in order that the channel may have a length substantially larger than a width of the gate electrode, increasing electrical characteristics of the MOS transistor.</p>
申请公布号 KR100611083(B1) 申请公布日期 2006.08.03
申请号 KR20050062137 申请日期 2005.07.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, KYOUNG YUN;KO, YONG SUN;SUH, CHUN SUK
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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