发明名称 ALIGNMENT SYSTEM FOR NANO IMPRINT LITHOGRAPHY AND METHOD OF IMPRINT LITHOGRAPHY USING THE SAME
摘要 <p>An alignment system used in nano-imprint lithography and a nano-imprint lithography method using the alignment system are provided. The alignment system includes: a plurality of electron emission devices, which are provided in the mold and emit electrons; and a plurality of electrodes, which are provided to face the electron emission devices and at which the electrons emitted from the electron emission devices arrive. The mold and the substrate are aligned with each other by maximizing the amount of current in each of the electrodes.</p>
申请公布号 KR20060087880(A) 申请公布日期 2006.08.03
申请号 KR20050008749 申请日期 2005.01.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SANG JUN;LEE, JUNG HYUN;LEE, SUK WON;LEE, MOON GU
分类号 H01L21/027 主分类号 H01L21/027
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