发明名称 Wet etching the edge and bevel of a silicon wafer
摘要 A method and apparatus to selectively etch layers of various materials from the edge and bevel areas of the active side of a silicon wafer, as well as from the inactive side of a wafer are disclosed. The width of the etched edge generally varies from about 0.5 to about 5 mm and however the etching may be determined by the geometry of the supporting chuck and the surface tension of the etching medium.
申请公布号 US2006172538(A1) 申请公布日期 2006.08.03
申请号 US20050294644 申请日期 2005.12.05
申请人 ITZKOWITZ HERMAN;TADDEI JOHN 发明人 ITZKOWITZ HERMAN;TADDEI JOHN
分类号 H01L21/302 主分类号 H01L21/302
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