发明名称 |
Method and apparatus for determining a pose of an implant |
摘要 |
A method for determining a pose of an implant object that is located inside a human or animal body uses a CAD model of that implant through a reconstruction X-Ray procedure that encompasses a translation-reconstruction run of the X-Ray arrangement viz ô viz the implant object. In particular, the method being comprises for an implant object that has a degree of symmetry according to an n-dimensional structure of symmetry the following. generating a first measurement configuration and a second measurement configuration regarding an X-Ray source and a prespecified implant position, and generating a first and a second implant shadow, respectively; assuming for each first and second measurement configuration an instance of the n-dimensional structure of symmetry; calculating for each of the first and second measurement configuration a pair of alternative poses of the implant object as being symmetrical with respect to the n-dimensional structure; and finding among the pairs of alternative poses two matching poses that thereby produce an angle information with respect to the n-dimensional structure of symmetry.
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申请公布号 |
US2006173286(A1) |
申请公布日期 |
2006.08.03 |
申请号 |
US20050538581 |
申请日期 |
2005.06.15 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
ERMES JEAN-PIERRE FRANCISCUS A.M. |
分类号 |
A61B5/05;A61B6/00;G06T7/00 |
主分类号 |
A61B5/05 |
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